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  • Terms: Slide Rules  
  • Terms: Weights and Measures  
  • Terms: scientific instruments -- physics  
  • Terms: Microtomes  
  • Terms: Cameras  
  • Terms: C3-D4  
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Published

Bausch & Lomb Optical Co., Rochester, NY (19)
Carl Leiss, Berlin (18)
R. Fuess, Berlin (12)
Carl Zeiss, Jena, Germany (4)
E. Leitz, Inc., New York (4)
Keuffel & Esser Co., New York (4)
Carl Zeiss, Inc./ New York (3)
Edward Paterson, London (3)
Ernst Leitz, Wetzlar, Germany (3)
R. Fuess, Inc., New York (3)
Spencer Lens Company, Buffalo, NY (3)
Cook, Troughton & Simms, Ltd., London (2)
E. Leitz, Inc., NY (2)
Elliott Brothers, London (2)
Fairchild Aerial Camera Corporation, New York (2)
Henry Hughes and Son, Ltd., London (2)
L. Casella, [London?] (2)
Macmillan and Co., London (2)
Spencer Lens Company, Boston (2)
Union College Review, Schenectady, NY (2)
Alfred Apps, London (1)
Apps, London (1)
Arthur H. Thomas Company, Philadelphia (1)
Baillière, Tindall and Cox, London (1)
Carl Zeiss/ Jena (1)
Centennial Photo Service, Grantsburg, WI (1)
Central Camera Company, Chicago (1)
Central Scientific Company, Chicago (1)
Cooke, Troughton & Simms, Ltd., London (1)
D. Van Nostrand, New York (1)
Die Medizinische Welt, Stuttgart, Germany (1)
E. Letiz, Inc., New York (1)
E. Letiz, Inc./ NY (1)
Ernst Leitz Optical Works, Wetzlar, Germany (1)
Ernst Leitz, Inc., New York (1)
Exposição Nacional de Metrologia, Lisbon (1)
Friedr. Vieweg & Sohn, Brunswick, German; Julius Spinger, Berlin (1)
Friedrich Vieweg und Sohn, Brunswick, Germany (1)
Gaumont, Paris (1)
General Precision Equipment Corporation, Rochester, NY (1)
Graflex, Inc., Rochester, NY (1)
Gundlach-Manhattan Optical Company, Rochester, NY (1)
Henry Winter, South Hanover, MA (1)
Her Majesty's Stationery Office, London (1)
Industria Grafica Atesina, Trento, Italy (1)
J. Carpentier, Paris (1)
Journal of Scientific Instruments (1)
Kaiserliche Normal-Eichungs-Kommission, Berlin-Charlottenberg (1)
Keuffel & Esser Co., NY (1)
L. Clark, Muirhead, & Co., London (1)

Year

0 (66)
1937 (6)
1955 (5)
1924 (4)
1922 (3)
1925 (3)
1928 (3)
1930 (3)
1936 (3)
1938 (3)
1940 (3)
1877 (2)
1898 (2)
1921 (2)
1926 (2)
1932 (2)
1935 (2)
1956 (2)
1957 (2)
1968 (2)
1982 (2)
1983 (2)
1862 (1)
1863 (1)
1870 (1)
1871 (1)
1872 (1)
1878 (1)
1879 (1)
1880 (1)
1882 (1)
1884 (1)
1889 (1)
1891 (1)
1900 (1)
1903 (1)
1904 (1)
1906 (1)
1910 (1)
1912 (1)
1919 (1)
1923 (1)
1927 (1)
1929 (1)
1934 (1)
1939 (1)
1942 (1)
1947 (1)
1949 (1)
1950 (1)

Thesaurus *

C3-D4 (114)
Optical Instruments (57)
Cameras (30)
Microscopes (28)
Carl Leiss (21)
R. Fuess (15)
Bausch & Lomb Optical Company (12)
C3-D1 (11)
Microtomes (10)
Photography (8)
Microscopes -- History (8)
Scientific Instruments (6)
Slide Rules (6)
scientific instruments -- physics (6)
Weights and Measures (5)
Spencer Lens Company (5)
Carl Zeiss, Jena (5)
Keuffel & Esser Co. (5)
C5-H3 (5)
Bausch and Lomb (4)
Ernst Leitz (4)
E. Leitz, Inc. (4)
Electrical Instruments (4)
Chemistry -- History (4)
Bausch & Lomb Optical Co. (4)
C5-A3 (4)
C5-D3 (4)
Balances (3)
Drawing Instruments (3)
Electricity (3)
Edward Paterson (3)
Cooke, Troughton & Simms, Ltd. (3)
photography -- equipment (3)
C3-C1 (3)
C3-I3 (3)
C5-H2 (3)
Optics (2)
Calculating Instruments (2)
Compasses (2)
Carl Zeiss Inc. (2)
Elliott Brothers (2)
L. Casella (2)
Les Fils d'Émile Deyrolle (2)
Microtomes -- Thoma (2)
Micrometer (2)
Microscopes -- Polarizing (2)
Union College -- Microscope Collection (2)
Astronomy -- American (2)
U.S. Naval Observatory (2)
Henry Hughes and Son, Limited (2)

My Object Lists

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413: Polarisations- Mikroskope

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1872 Catalogue of Electrical Test Instruments

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Anthony Van Leeuwenhoek and His Microscopes

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Apparate für Untersuchen im sichtbaren Gebeit

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Les Appareils Gaumont

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Apps' Patent Inductorium

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At the Sign of the Orrery: The Origins of the Firm of Cooke, Troughton & Simms, Ltd.

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Bausch & Lomb Dynoptic Laboratory Microscopes

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Bausch & Lomb Petrological Microscopes

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Bausch & Lomb Scientific Instruments (collection of catalogues)

Sub-Title: Dupe
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Bausch & Lomb Scientific Instruments: Price List

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Beobachtung der Interferenzfiguren im konvergenten Licht durch das Mikroskop

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